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Semiconductor Test Probe Pogo Pin Scpb038 For Ic Inspection - Hong Kong

price: contact company for price

Semiconductor Test Probe Pogo Pin SCPB038 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins.

Common tip styles include B, J, J1, U, U1, etc.

All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict.

They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPB038 we will introduce is 0.38 mm in barrel diameter and 6 mm in total length.

It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices.

Developed and manufactured on our own, this product takes the lead in the test industry.

Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold The bottom plunger is made from beryllium copper plated with nickel and gold.

The same is with the top plunger.

The inner spring is made from music wire plated with gold and nickel.

This probe pin could withstand the current up to 1.5 amps.

The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1 mm.

But it is better to be pressed at a distance of 0.6 mm at most in working environments.

Otherwise, the spring will probably be damaged severely under constant pressure.

When the plunger is pressed at a distance of 0.6 mm, the loaded force is about 25 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.

Materials (plated)

Barrel: Ph, Au on Ni Plated

X: Bottom (Plunger 1): Beryllium Copper, Au on Ni Plated

Y: Top (Plunger 2): Beryllium Copper, Au on Ni Plated

Spring: SWP-A/B, Au on Ni Plated Electronic Specification:

Current Rating: 1.5 amps

Contact Resistance: 100 milliohms max

Bandwidth: 5.3 GHz at -1dB

Propagation Delay: 27 ps

Inductive Reactance: 1MHZ at -0.02809 uH

Capacitive Reactance: 1MHZ at 0.876347 uF Specifications:

Full Stroke: 1 mm

Rated Stroke: 0.6 mm

Spring Force: 25±7 gf at load 0.6 mm

Mechanical Life: about 200000 cycles Company Information:

Centalic Technology Development Ltd was founded in 1980 - Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets.

With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world.

Welcome to browse our website centalic.

com and download any catalogs of our products.

If you need a complete set of product manual, please feel free to contact us.

Many products are not uploaded due to a huge range.

If you can't find what you need, please feel free to contact us.


Company Contact:


  • Phone: +85252857123

  • Address: Room B, 4/F, Good Luck Industrial Building, 105 How Ming Street, Kwun Tong, Kowloon , Hong Kong

  • Email: Email


Published date: December 1, 2022

  • Business Description: We are test probe/pin manufacturer and having more than 30 years production experience.

    Our products are applied to IC and In-circuit testing fields.

    Further, we also provide the tailor made service not only test pins but also small metal parts.

    Centalic Technology Development Ltd. was established in 1980 as a manufacturer to provide PCB hold-drilling service to customers.

    Foreseeing the rapid development of PCB industry, Centalic also developed her technology and transformed to be a manufacturer of PCB bare-board testers in 1985 - 30 years experiences in PCB testing industries, we have built up a solid background and technology on manufacturing Test System, Test Probes, Test Fixture and Fixture accessories for PCB and electronic assembly industries.

    In 1992, Centalic has expanded her production capabilities by moving to the new factory in China.

    As our business keeps growing, we have set up another factory in China in 1999 and sales offices in Shanghai and with the head office in Hong Kong.

    In 2006, the Suzhou office was set up to expand the sales network in Northern China.

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